Nandor Toth

Publications

  1. A PNP-Based Temperature Sensor With Continuous-Time Readout and ± 0.1 °C (3σ) Inaccuracy From -55 °C to 125 °C
    Toth, Nandor G.; Tang, Zhong; Someya, Teruki; Pan, Sining; Makinwa, Kofi A. A.;
    IEEE Journal of Solid-State Circuits,
    pp. 1-10, 2024. DOI: 10.1109/JSSC.2024.3402131
    Keywords: ... Temperature sensors; Resistors; Energy efficiency; Instruments; Temperature dependence; Modulation; Energy resolution;Bitstream-controlled (BSC) dynamic-element-matching (DEM);continuous-time (CT) ΔΣ-modulator; current-mode readout; PNP-based temperature sensor; resistor ratio self-calibration.

    Abstract: ... This article describes a PNP-based temperature sensor that achieves both high energy efficiency and accuracy. Two resistors convert the CTAT and PTAT voltages generated by a PNP-based front-end into two currents whose ratio is then digitized by a continuous-time (CT) ΔΣ-modulator. Chopping and dynamic-element-matching (DEM) are used to mitigate the effects of component mismatch and 1/f noise, while the spread in VBE and in the ratio of the two resistors is digitally trimmed at room temperature (RT). Fabricated in a 0.18 μm CMOS process, the sensor occupies 0.12 mm2, and draws 9.5 μA from a supply voltage ranging from 1.7 to 2.2 V. Measurements on 40 samples from one batch show that it achieves an inaccuracy of ±0.1 °C (3σ ) from −55 °C to 125 °C, and a commensurate supply sensitivity of only 0.01 °C/V. Furthermore, it achieves high energy efficiency, with a resolution Figure of Merit (FoM) of 0.85 pJ·K2.

  2. A BJT-Based Temperature Sensor with±0.1°C (3σ) Inaccuracy from -55°C to 125°C and a 0.85pJ.K2 Resolution FoM Using Continuous-Time Readout
    Toth, Nandor G.; Tang, Zhong; Someya, Teruki; Pan, Sining; Makinwa, Kofi A. A.;
    In 2023 IEEE International Solid-State Circuits Conference (ISSCC),
    pp. 358-360, 2023. DOI: 10.1109/ISSCC42615.2023.10067457

  3. A 40A Shunt-Based Current Sensor with ±0.2% Gain Error from −40°C to 125°C and Self-Calibration
    Tang, Zhong; Toth, Nandor G.; Zamparette, Roger; Nezuka, Tomohiro; Furuta, Yoshikazu; Makinwa, Kofi A. A.;
    In 2023 IEEE International Solid-State Circuits Conference (ISSCC),
    pp. 348-350, 2023. DOI: 10.1109/ISSCC42615.2023.10067304

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