PRORISC and SAFE 2019
- Thursday, 4 -- Friday, 5 July 2019
- Aula Conference Centre of TUDelft
PRORISC and SAFE 2019
PRORISC is an annual conference on Integrated Circuit (IC) design and SAFE is an annual conference on Microsystems, Materials, Technology and RF-devices. Both conferences are organized together within the three technical Dutch universities Twente, Delft and Eindhoven. The conference is organized by PhD students and is intended for PhD candidates to expand their network and share their research ideas, which provides a unique opportunity for future collaborations. Each year, one of the technical universities will be responsible for the organization of the two conferences. In 2019 the PRORISC will be held at at the campus of Delft University of Technology.Additional information ...
Smart Sensor Systems
- Monday, 8 -- Friday, 12 April 2019
- TU Delft / EWI
Smart Sensor Systems
This course addresses the design and development of smart sensor systems. After a general overview, various key aspects of sensor systems are discussed: measurement and calibration techniques, the design of precision sensor interfaces, analog-to-digital conversion techniques, and sensing principles for the measurement of magnetic fields, temperature, capacitance, acceleration and rotation. The state-of-the-art smart sensor systems covered by the course include smart magnetic-field sensors, smart temperature sensors, physical chemosensors, multi-electrode capacitive sensors, implantable smart sensors, DNA microarrays, smart inertial sensors, smart optical microsystems and CMOS image sensors. A systematic approach towards the design of smart sensor systems is presented. The lectures are augmented by case studies and hands-on demonstrations.Additional information ...
Micro electronics colloquium
- Thursday, 28 March 2019
- EEMCS, Restaurantzaal
High performance data converters; Rethink analog IC designNan Sun, Muhammed Bolatkale
Nan Sun: Rethink Analog IC DesignI will present several unconventional data conversion architectures. First, I will talk about how we can make use of noise, which is usually deemed as an undesirable thing, to estimate the conversion residue and increase the SNR of a SAR ADC. It is an interesting example of stochastic resonance, in which the presence of noise can lead to not SNR degradation but SNR enhancement. Second, I will talk about how we can perform data conversion below the Nyquist rate by exploiting the sparsity of the input signal. I will show two example compressive sensing ADCs and how the effective ADC conversion rate can be reduced by 4 times but without losing information. Third, I will show how we can prevent the seemingly inevitable kT/C noise in a Nyquist-rate pipelined ADC by using a continuous-time SAR based 1st-stage. This can substantially reduce the requirement on the ADC input capacitance, greatly reducing the ADC driver power and reference buffer power
Biography of Nan SunNan Sun is Associate Professor at the University of Texas at Austin. He received the B.S. from Tsinghua in 2006 and Ph.D. degree from Harvard in 2010. Dr. Sun received the NSF Career Award in 2013. He serves on the Technical Program Committee of the IEEE Custom Integrated Circuits Conference and the IEEE Asian Solid-State Circuit Conference. He is an Associate Editor of the IEEE Transactions on Circuits and Systems – I: Regular Papers, and a Guest Editor of the IEEE Journal of Solid-State Circuits. He also serves as IEEE Circuits-and-Systems Society Distinguished Lecturer from 2019 to 2020.
Muhammed Bolatkale: High Performance Data ConvertersA next generation automotive radio receiver, an all-digital Class-D amplifier, and an advanced Bluetooth transceiver have one thing in common: they rely on high-performance data converter architectures to enable best in class performance. This talk will give an overview of GHz-sampling data converters, especially focusing on wideband delta-sigma and hybrid data converter architectures. We will touch upon state-of-the-art systems and circuit level designs fabricated in advance CMOS nodes.
Bio Muhammed BolatkaleMuhammed Bolatkale is Senior Principle Scientist at NXP Semiconductors and part-time Associate Professor in the Electronics Instrumentation Laboratory at Delft University of Technology. He received his B. Sc. (high honors) degree from Middle East Technical University, Turkey, in 2004 and the M. Sc. (cum laude) and Ph.D. degrees in Electrical Engineering from Delft University of Technology, the Netherlands, in 2007 and 2013. Since 2007, Dr. Bolatkale has worked for NXP Semiconductors, specializing in wideband Delta-Sigma ADCs for wireless communications and automotive applications. Dr. Bolatkale received the ISSCC 2016 and 2011 Jan Van Vessem Award for Outstanding European Paper and the IEEE Journal of Solid-State Circuits 2016 and 2011 Best Paper Award.Additional information ...